Publication

Title: Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition
Journal: Optics Express
Volume: 24
Pages: 17303-17312
NaFoMat Authors: Raúl de la Fuente Carballo, Luis Miguel Varela Cabo
Full Athorship: Arosa, Yago; Lago, Elena López; Varela, Luis Miguel; de la Fuente, Raúl;
Year: 2016

Citation: Arosa et al 2016 Opt. Express 24 17303-17312